Transmission Electron Microscopy

Version	Summary	Created by	Modification	Content Size	Created at	Operation
1	handwiki	Dean Liu	--	11178	2022-11-15 01:33:26

The content is sourced from: https://handwiki.org/wiki/Engineering:Transmission_electron_microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device. Transmission electron microscopes are capable of imaging at a significantly higher resolution than light microscopes, owing to the smaller de Broglie wavelength of electrons. This enables the instrument to capture fine detail—even as small as a single column of atoms, which is thousands of times smaller than a resolvable object seen in a light microscope. Transmission electron microscopy is a major analytical method in the physical, chemical and biological sciences. TEMs find application in cancer research, virology, and materials science as well as pollution, nanotechnology and semiconductor research, but also in other fields such as paleontology and palynology. TEM instruments have multiple operating modes including conventional imaging, scanning TEM imaging (STEM), diffraction, spectroscopy, and combinations of these. Even within conventional imaging, there are many fundamentally different ways that contrast is produced, called "image contrast mechanisms". Contrast can arise from position-to-position differences in the thickness or density ("mass-thickness contrast"), atomic number ("Z contrast", referring to the common abbreviation Z for atomic number), crystal structure or orientation ("crystallographic contrast" or "diffraction contrast"), the slight quantum-mechanical phase shifts that individual atoms produce in electrons that pass through them ("phase contrast"), the energy lost by electrons on passing through the sample ("spectrum imaging") and more. Each mechanism tells the user a different kind of information, depending not only on the contrast mechanism but on how the microscope is used—the settings of lenses, apertures, and detectors. What this means is that a TEM is capable of returning an extraordinary variety of nanometer- and atomic-resolution information, in ideal cases revealing not only where all the atoms are but what kinds of atoms they are and how they are bonded to each other. For this reason TEM is regarded as an essential tool for nanoscience in both biological and materials fields. The first TEM was demonstrated by Max Knoll and Ernst Ruska in 1931, with this group developing the first TEM with resolution greater than that of light in 1933 and the first commercial TEM in 1939. In 1986, Ruska was awarded the Nobel Prize in physics for the development of transmission electron microscopy.

palynology materials science virology

References

ultraviolet microscope. (2010). In Encyclopædia Britannica. Retrieved November 20, 2010, from Encyclopædia Britannica Online http://www.britannica.com/EBchecked/topic/613520/ultraviolet-microscope
Ernst Ruska (January 1980). The Early Development of Electron Lenses and Electron Microscopy. Applied Optics. 25. pp. 820. ISBN 978-3-7776-0364-3. Bibcode: 1986ApOpt..25..820R. http://adsabs.harvard.edu/abs/1986ApOpt..25..820R
Plücker, J. (1858). "Über die Einwirkung des Magneten auf die elektrischen Entladungen in verdünnten Gasen". Poggendorffs Annalen der Physik und Chemie 103 (1): 88–106. doi:10.1002/andp.18581790106. Bibcode: 1858AnP...179...88P. https://books.google.com/books?id=j2UEAAAAYAAJ&pg=PA88.
"Ferdinand Braun, The Nobel Prize in Physics 1909, Biography". nobelprize.org. http://nobelprize.org/nobel_prizes/physics/laureates/1909/braun-bio.html.
"The Nobel Prize in Physics 1986, Perspectives – Life through a Lens". http://nobelprize.org/nobel_prizes/physics/laureates/1986/perspectives.html.
Rudenberg, Reinhold (May 30, 1931). "Configuration for the enlarged imaging of objects by electron beams". Patent DE906737. http://v3.espacenet.com/searchResults?locale=en_GB&PN=DE906737&compact=false&DB=EPODOC.
Broglie, L. (1928). "La nouvelle dynamique des quanta". Électrons et Photons: Rapports et Discussions du Cinquième Conseil de Physique. Solvay.
"A Brief History of the Microscopy Society of America". microscopy.org. http://www.microscopy.org/about/history.cfm.
"Dr. James Hillier, Biography". comdir.bfree.on.ca. http://comdir.bfree.on.ca/hillier/hilbio.htm.
Hawkes, P., ed (1985). The beginnings of Electron Microscopy. Academic Press. ISBN 978-0120145782.
"Ernst Ruska, Nobel Prize Lecture". nobelprize.org. http://nobelprize.org/nobel_prizes/physics/laureates/1986/ruska-lecture.html.
Crewe, Albert V; Isaacson, M.; Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Instrum. 40 (2): 241–246. doi:10.1063/1.1683910. Bibcode: 1969RScI...40..241C. https://digital.library.unt.edu/ark:/67531/metadc1061663/.
Crewe, Albert V.; Wall, J.; Langmore, J. (1970). "Visibility of a single atom". Science 168 (3937): 1338–1340. doi:10.1126/science.168.3937.1338. PMID 17731040. Bibcode: 1970Sci...168.1338C. https://dx.doi.org/10.1126%2Fscience.168.3937.1338
Meyer, Jannik C.; Girit, C. O.; Crommie, M. F.; Zettl, A. (2008). "Imaging and dynamics of light atoms and molecules on graphene". Nature 454 (7202): 319–22. doi:10.1038/nature07094. PMID 18633414. Bibcode: 2008Natur.454..319M. http://physics.berkeley.edu/research/zettl/pdf/350.Nature.454-Meyer.pdf. Retrieved 3 June 2012.
Fultz, B; Howe, J (2007). Transmission Electron Microscopy and Diffractometry of Materials. Springer. ISBN 978-3-540-73885-5.
Murphy, Douglas B. (2002). Fundamentals of Light Microscopy and Electronic Imaging. New York: John Wiley & Sons. ISBN 9780471234296.
Champness, P. E. (2001). Electron Diffraction in the Transmission Electron Microscope. Garland Science. ISBN 978-1859961476.
Hubbard, A (1995). The Handbook of surface imaging and visualization. CRC Press. ISBN 978-0-8493-8911-5. https://archive.org/details/handbookofsurfac0000unse.
Egerton, R (2005). Physical principles of electron microscopy. Springer. ISBN 978-0-387-25800-3.
Rose, H H (2008). "Optics of high-performance electron Microscopes". Science and Technology of Advanced Materials 9 (1): 014107. doi:10.1088/0031-8949/9/1/014107. PMID 27877933. Bibcode: 2008STAdM...9a4107R. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=5099802
"The objective lens of a TEM, the heart of the electron microscope". rodenburg.org. http://www.rodenburg.org/guide/t700.html.
Pogany, A. P.; Turner, P. S. (1968-01-23). "Reciprocity in electron diffraction and microscopy". Acta Crystallographica Section A 24 (1): 103–109. doi:10.1107/S0567739468000136. ISSN 1600-5724. Bibcode: 1968AcCrA..24..103P. https://dx.doi.org/10.1107%2FS0567739468000136
Hren, John J; Goldstein, Joseph I; Joy, David C, eds (1979). Introduction to Analytical Electron Microscopy. doi:10.1007/978-1-4757-5581-7. ISBN 978-1-4757-5583-1. https://link.springer.com/content/pdf/10.1007/978-1-4757-5581-7.pdf.
Faruqi, A. R; Henderson, R. (2007-10-01). "Electronic detectors for electron microscopy". Current Opinion in Structural Biology. Carbohydrates and glycoconjugates / Biophysical methods 17 (5): 549–555. doi:10.1016/j.sbi.2007.08.014. ISSN 0959-440X. PMID 17913494. http://www.sciencedirect.com/science/article/pii/S0959440X07001212.
Henderson, R.; Cattermole, D.; McMullan, G.; Scotcher, S.; Fordham, M.; Amos, W. B.; Faruqi, A. R. (2007-02-01). "Digitisation of electron microscope films: Six useful tests applied to three film scanners". Ultramicroscopy 107 (2): 73–80. doi:10.1016/j.ultramic.2006.05.003. ISSN 0304-3991. PMID 16872749. http://www.sciencedirect.com/science/article/pii/S030439910600088X.
Williams, D.; Carter, C. B. (1996). Transmission Electron Microscopy, Vol. 1 – Basics. Plenum Press. ISBN 978-0-306-45324-3. https://archive.org/details/transmissionelec0002will.
Roberts, P. T. E.; Chapman, J. N.; MacLeod, A. M. (1982-01-01). "A CCD-based image recording system for the CTEM". Ultramicroscopy 8 (4): 385–396. doi:10.1016/0304-3991(82)90061-4. ISSN 0304-3991. https://dx.doi.org/10.1016%2F0304-3991%2882%2990061-4
Fan, G. Y.; Ellisman, M. H. (24 December 2001). "Digital imaging in transmission electron microscopy". Journal of Microscopy 200 (1): 1–13. doi:10.1046/j.1365-2818.2000.00737.x. ISSN 0022-2720. PMID 11012823. https://dx.doi.org/10.1046%2Fj.1365-2818.2000.00737.x
McMullan, G.; Faruqi, A.R.; Henderson, R. (2016). "Direct Electron Detectors". Methods in Enzymology (Elsevier) 579: 1–17. doi:10.1016/bs.mie.2016.05.056. ISBN 978-0-12-805382-9. PMID 27572721. https://dx.doi.org/10.1016%2Fbs.mie.2016.05.056
Faruqi, A.R.; Henderson, R.; Pryddetch, M.; Allport, P.; Evans, A. (October 2006). "Erratum to: "Direct single electron detection with a CMOS detector for electron microscopy"". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 566 (2): 770. doi:10.1016/j.nima.2006.07.013. ISSN 0168-9002. https://dx.doi.org/10.1016%2Fj.nima.2006.07.013
Ercius, P.; Caswell, T.; Tate, M.W.; Ercan, A.; Gruner, S.M.; Muller, D. (September 2005). "A Pixel Array Detector for Scanning Transmission Electron Microscopy". Microscopy and Microanalysis 14 (S2): 806–807. doi:10.1017/s1431927608085711. ISSN 1431-9276. https://dx.doi.org/10.1017%2Fs1431927608085711
McMullan, G.; Faruqi, A.R.; Henderson, R.; Guerrini, N.; Turchetta, R.; Jacobs, A.; van Hoften, G. (18 May 2009). "Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector". Ultramicroscopy 109 (9): 1144–1147. doi:10.1016/j.ultramic.2009.05.005. PMID 19541421. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=2937214
Ruskin, Rachel S.; Yu, Zhiheng; Grigorieff, Nikolaus (1 November 2013). "Quantitative characterization of electron detectors for transmission electron microscopy". Journal of Structural Biology 184 (3): 385–393. doi:10.1016/j.jsb.2013.10.016. PMID 24189638. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=3876735
Rodenburg, J M. "The Vacuum System". rodenburg.org. http://www.rodenburg.org/guide/t1400.html.
Ross, L. E, Dykstra, M (2003). Biological Electron Microscopy: Theory, techniques and troubleshooting. Springer. ISBN 978-0306477492.
Chapman, S. K. (1986). Maintaining and Monitoring the Transmission Electron Microscope. Royal Microscopical Society Microscopy Handbooks. 08. Oxford University Press. ISBN 978-0-19-856407-2.
Pulokas, James; Green, Carmen; Kisseberth, Nick; Potter, Clinton S.; Carragher, Bridget (1999). "Improving the Positional Accuracy of the Goniometer on the Philips CM Series TEM". Journal of Structural Biology 128 (3): 250–256. doi:10.1006/jsbi.1999.4181. PMID 10633064. https://dx.doi.org/10.1006%2Fjsbi.1999.4181
Buckingham, J (1965). "Thermionic emission properties of a lanthanum hexaboride/rhenium cathode". British Journal of Applied Physics 16 (12): 1821. doi:10.1088/0508-3443/16/12/306. Bibcode: 1965BJAP...16.1821B. https://dx.doi.org/10.1088%2F0508-3443%2F16%2F12%2F306
Orloff, J, ed (1997). Handbook of Electron Optics. CRC-press. ISBN 978-0-8493-2513-7.
Reimer, L; Kohl, H (2008). Transmission Electron Microscopy: Physics of Image Formation. Springer. ISBN 978-0-387-34758-5.
Cowley, J. M (1995). Diffraction physics. Elsevier Science B. V.. ISBN 978-0-444-82218-5.
Kirkland, E (1998). Advanced computing in Electron Microscopy. Springer. ISBN 978-0-306-45936-8.
Hull, D.; Bacon, J (2001). Introduction to dislocations (4th ed.). Butterworth-Heinemann. ISBN 978-0-7506-4681-9.
Cowley, J. M.; Moodie, A. F. (1957). "The Scattering of Electrons by Atoms and Crystals. I. A New Theoretical Approach". Acta Crystallographica 199 (3): 609–619. doi:10.1107/S0365110X57002194. http://journals.iucr.org/q/issues/1957/10/00/a02113/a02113.pdf.
Egerton, R. F. (1996). Electron Energy-loss Spectroscopy in the Electron Microscope. Springer. ISBN 978-0-306-45223-9.
Frank, J, ed (2006). Electron tomography: methods for three-dimensional visualization of structures in the cell. Springer. ISBN 978-0-387-31234-7.
Levin, B. D. A. (2016). "Nanomaterial datasets to advance tomography in scanning transmission electron microscopy". Scientific Data 3: 160041. doi:10.1038/sdata.2016.41. PMID 27272459. Bibcode: 2016NatSD...360041L. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=4896123
Kawase, Noboru; Kato, Mitsuro; Jinnai, Hiroshi; Jinnai, H (2007). "Transmission electron microtomography without the 'missing wedge' for quantitative structural analysis". Ultramicroscopy 107 (1): 8–15. doi:10.1016/j.ultramic.2006.04.007. PMID 16730409. https://dx.doi.org/10.1016%2Fj.ultramic.2006.04.007
Heidari, Hamed; Van den Broek, Wouter; Bals, Sara (2013). "Quantitative electron tomography: The effect of the three-dimensional point spread function". Ultramicroscopy 135: 1–5. doi:10.1016/j.ultramic.2013.06.005. PMID 23872036. https://dx.doi.org/10.1016%2Fj.ultramic.2013.06.005
Cheville, NF; Stasko J (2014). "Techniques in Electron Microscopy of Animal Tissue". Veterinary Pathology 51 (1): 28–41. doi:10.1177/0300985813505114. PMID 24114311. https://dx.doi.org/10.1177%2F0300985813505114
Amzallag, Arnaud; Vaillant, Cédric; Jacob, Mathews; Unser, Michael; Bednar, Jan; Kahn, Jason D.; Dubochet, Jacques; Stasiak, Andrzej et al. (2006). "3D reconstruction and comparison of shapes of DNA minicircles observed by cryo-electron microscopy". Nucleic Acids Research 34 (18): e125. doi:10.1093/nar/gkl675. PMID 17012274. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=1635295
Porter, K; Blum, J (1953). "A study in Microtomy for Electron Microscopy". The Anatomical Record 117 (4): 685–710. doi:10.1002/ar.1091170403. PMID 13124776. https://dx.doi.org/10.1002%2Far.1091170403
Phillips (1961). "Diamond knife ultra microtomy of metals and the structure of microtomed sections". British Journal of Applied Physics 12 (10): 554. doi:10.1088/0508-3443/12/10/308. Bibcode: 1961BJAP...12..554P. https://dx.doi.org/10.1088%2F0508-3443%2F12%2F10%2F308
Alberts, Bruce (2008). Molecular biology of the cell (5th ed.). New York: Garland Science. ISBN 978-0815341116.
Bean, J. J.; Saito, M.; Fukami, S.; Sato, H.; Ikeda, S.; Ohno, H.; Ikuhara, Y.; Mckenna, K. P. (2017). "Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices". Scientific Reports 7: 45594. doi:10.1038/srep45594. ISSN 2045-2322. PMID 28374755. Bibcode: 2017NatSR...745594B. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=5379487
Baram, M.; Kaplan W. D. (2008). "Quantitative HRTEM analysis of FIB prepared specimens". Journal of Microscopy 232 (3): 395–405. doi:10.1111/j.1365-2818.2008.02134.x. PMID 19094016. https://dx.doi.org/10.1111%2Fj.1365-2818.2008.02134.x
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian et al. (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. https://www.researchgate.net/publication/342952945.
Nebesářová1, Jana; Vancová, Marie (2007). "How to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis 13 (3): 248–249. doi:10.1017/S143192760708124X. Bibcode: 2007MiMic..13S.248N. http://journals.cambridge.org/action/displayFulltext?type=1&fid=1330184&jid=MAM&volumeId=13&issueId=S03&aid=1330180. Retrieved 8 August 2016.
Drummy, Lawrence, F.; Yang, Junyan; Martin, David C. (2004). "Low-voltage electron microscopy of polymer and organic molecular thin films". Ultramicroscopy 99 (4): 247–256. doi:10.1016/j.ultramic.2004.01.011. PMID 15149719. https://dx.doi.org/10.1016%2Fj.ultramic.2004.01.011
Li, Z; Baker, ML; Jiang, W; Estes, MK; Prasad, BV (2009). "Rotavirus Architecture at Subnanometer Resolution". Journal of Virology 83 (4): 1754–1766. doi:10.1128/JVI.01855-08. PMID 19036817. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=2643745
M.J. Zachman (2016). "Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out". Microscopy and Microanalysis 22 (6): 1338–1349. doi:10.1017/S1431927616011892. PMID 27869059. Bibcode: 2016MiMic..22.1338Z. https://dx.doi.org/10.1017%2FS1431927616011892
Levin, B. D. A. (2017). "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts". Microscopy and Microanalysis 23 (1): 155–162. doi:10.1017/S1431927617000058. PMID 28228169. Bibcode: 2017MiMic..23..155L. https://zenodo.org/record/889883.
P.A. Crozier; T.W. Hansen (2014). "In situ and operando transmission electron microscopy of catalytic materials". MRS Bulletin 40: 38–45. doi:10.1557/mrs.2014.304. https://www.cambridge.org/core/journals/mrs-bulletin/article/div-classtitlespan-classitalicin-situspan-and-span-classitalicoperandospan-transmission-electron-microscopy-of-catalytic-materialsdiv/C874CFF58B3BD52B31CCC4ECAF40FDA8.
Kosasih, Felix Utama; Ducati, Caterina (May 2018). "Characterising degradation of perovskite solar cells through in-situ and operando electron microscopy". Nano Energy 47: 243–256. doi:10.1016/j.nanoen.2018.02.055. https://www.repository.cam.ac.uk/handle/1810/275845.
Shimizu, Toshiki; Lungerich, Dominik; Harano, Koji; Nakamura, Eiichi. "Time-Resolved Imaging of Stochastic Cascade Reactions over a Submillisecond to Second Time Range at the Angstrom Level". Journal of the American Chemical Society. doi:10.1021/jacs.2c02297. https://pubs.acs.org/doi/10.1021/jacs.2c02297. Retrieved 26 May 2022.
de Jonge, N.; Ross, F.M. (2011). "Electron microscopy of specimens in liquid". Nature Nanotechnology 6 (8): 695–704. doi:10.1038/nmat944. PMID 12872162. Bibcode: 2003NatMa...2..532W. https://dx.doi.org/10.1038%2Fnmat944
F. M. Ross (2015). "Opportunities and challenges in liquid cell electron microscopy". Science 350 (6267): 1490–1501. doi:10.1126/science.aaa9886. PMID 26680204. https://zenodo.org/record/1134697.
Haque, M. A.; Saif, M. T. A. (2001). "In-situ tensile testing of nano-scale specimens in SEM and TEM". Experimental Mechanics 42: 123. doi:10.1007/BF02411059. https://dx.doi.org/10.1007%2FBF02411059
Yaguchi, T.; Suzuki, M.; Watabe, A.; Nagakubo, Y.; Ueda, K.; Kamino, T. (2011-03-22). "Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM". Journal of Electron Microscopy 60 (3): 217–225. doi:10.1093/jmicro/dfr011. ISSN 0022-0744. PMID 21427119. https://dx.doi.org/10.1093%2Fjmicro%2Fdfr011
Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke; Crozier, P.A.; Kabius, Bernd C.; LaGrange, Thomas; Minor, Andrew M.; Takeda, Seiji et al. (November 2016). "Current status and future directions for in situ transmission electron microscopy". Ultramicroscopy 170: 86–95. doi:10.1016/j.ultramic.2016.08.007. PMID 27566048. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=5100813
van Omme, J. Tijn; Zakhozheva, Marina; Spruit, Ronald G.; Sholkina, Mariya; Pérez Garza, H. Hugo (September 2018). "Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability". Ultramicroscopy 192: 14–20. doi:10.1016/j.ultramic.2018.05.005. PMID 29802911. https://linkinghub.elsevier.com/retrieve/pii/S0304399118300299.
Saka, Hiroyasu; Kamino, Takeo; Ara, Shigeo; Sasaki, Katsuhiro (2008-02-01). "In Situ Heating Transmission Electron Microscopy". MRS Bulletin 33 (2): 93–100. doi:10.1557/mrs2008.21. ISSN 1938-1425. https://dx.doi.org/10.1557%2Fmrs2008.21
Zhang, Chao; Firestein, Konstantin L.; Fernando, Joseph F. S.; Siriwardena, Dumindu; Treifeldt, Joel E.; Golberg, Dmitri (2019-09-30). "Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials". Advanced Materials 32 (18): 1904094. doi:10.1002/adma.201904094. ISSN 0935-9648. PMID 31566272. https://dx.doi.org/10.1002%2Fadma.201904094
Picher, Matthieu; Mazzucco, Stefano; Blankenship, Steve; Sharma, Renu (2015-03-01). "Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy". Ultramicroscopy 150: 10–15. doi:10.1016/j.ultramic.2014.11.023. ISSN 0304-3991. PMID 25490533. https://www.sciencedirect.com/science/article/pii/S0304399114002393.
Niekiel, Florian; Kraschewski, Simon M.; Müller, Julian; Butz, Benjamin; Spiecker, Erdmann (2017-05-01). "Local temperature measurement in TEM by parallel beam electron diffraction". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy 176: 161–169. doi:10.1016/j.ultramic.2016.11.028. ISSN 0304-3991. PMID 28049586. https://www.sciencedirect.com/science/article/pii/S0304399116303680.
Vendelbo, S. B.; Kooyman, P. J.; Creemer, J. F.; Morana, B.; Mele, L.; Dona, P.; Nelissen, B. J.; Helveg, S. (2013-10-01). "Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy". Ultramicroscopy 133: 72–79. doi:10.1016/j.ultramic.2013.04.004. ISSN 0304-3991. PMID 23831940. Bibcode: 2013IJMSI.133...72V. https://www.sciencedirect.com/science/article/pii/S0304399113001101.
"TEAM 0.5". https://foundry.lbl.gov/instrumentation/team-0-5/.
Filleter, Tobin; Beese, Allison M. (2016), Bhushan, Bharat, ed., In Situ Transmission Electron Microscopy: Mechanical Testing, Dordrecht: Springer Netherlands, pp. 1543–1554, doi:10.1007/978-94-017-9780-1_100990, ISBN 978-94-017-9780-1 https://dx.doi.org/10.1007%2F978-94-017-9780-1_100990
Wilsdorf, H. G. F. (2004-12-29). "Apparatus for the Deformation of Foils in an Electron Microscope". Review of Scientific Instruments 29 (4): 323–324. doi:10.1063/1.1716192. ISSN 0034-6748. https://aip.scitation.org/doi/abs/10.1063/1.1716192.
Haque, M. A.; Espinosa, H. D.; Lee, H. J. (May 2010). "MEMS for In Situ Testing—Handling, Actuation, Loading, and Displacement Measurements". MRS Bulletin 35 (5): 375–381. doi:10.1557/mrs2010.570. ISSN 1938-1425. https://www.cambridge.org/core/journals/mrs-bulletin/article/abs/mems-for-in-situ-testinghandling-actuation-loading-and-displacement-measurements/0BFB4803AC91CB6A9B544537C2A93B55#access-block.
Wang, Xiaodong; Mao, Shengcheng; Zhang, Jianfei; Li, Zhipeng; Deng, Qingsong; Ning, Jin; Yang, Xudong; Wang, Li et al. (24 January 2017). "MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope". Micromachines 8 (2): 31. doi:10.3390/mi8020031. https://dx.doi.org/10.3390%2Fmi8020031
Williams, David B.; Carter, C. Barry (1996), Williams, David B.; Carter, C. Barry, eds., "The Transmission Electron Microscope", Transmission Electron Microscopy: A Textbook for Materials Science (Boston, MA: Springer US): pp. 3–17, doi:10.1007/978-1-4757-2519-3_1, ISBN 978-1-4757-2519-3 https://dx.doi.org/10.1007%2F978-1-4757-2519-3_1
Dömer, H.; Bostanjoglo, O. (2003-09-25). "High-speed transmission electron microscope". Review of Scientific Instruments 74 (10): 4369–4372. doi:10.1063/1.1611612. ISSN 0034-6748. Bibcode: 2003RScI...74.4369D. https://dx.doi.org/10.1063%2F1.1611612
Oldfield, L. C. (June 1976). "A rotationally symmetric electron beam chopper for picosecond pulses". Journal of Physics E: Scientific Instruments 9 (6): 455–463. doi:10.1088/0022-3735/9/6/011. ISSN 0022-3735. Bibcode: 1976JPhE....9..455O. https://dx.doi.org/10.1088%2F0022-3735%2F9%2F6%2F011
Feist, Armin; Bach, Nora; Rubiano da Silva, Nara; Danz, Thomas; Möller, Marcel; Priebe, Katharina E.; Domröse, Till; Gatzmann, J. Gregor et al. (2017-05-01). "Ultrafast Transmission Electron Microscopy Using a Laser-Driven Field Emitter: Femtosecond Resolution with a High Coherence Electron Beam". Ultramicroscopy. 70th Birthday of Robert Sinclair and 65th Birthday of Nestor J. Zaluzec PICO 2017 – Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy 176: 63–73. doi:10.1016/j.ultramic.2016.12.005. PMID 28139341. https://dx.doi.org/10.1016%2Fj.ultramic.2016.12.005
Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K. (2014-11-03). "Time resolved electron microscopy for in situ experiments". Applied Physics Reviews 1 (4): 041101. doi:10.1063/1.4900509. Bibcode: 2014ApPRv...1d1101C. https://dx.doi.org/10.1063%2F1.4900509
A. H. Zewail (9 Apr 2010). "Four-Dimensional Electron Microscopy". Science 328 (5975): 187–193. doi:10.1126/science.1166135. PMID 20378810. Bibcode: 2010Sci...328..187Z. https://www.science.org/doi/10.1126/science.1166135.
Lobatsov, Vladimir A.; Ramesh Srinivasan; Ahmed H. Zewail (2005-05-09). "Four-dimensional ultrafast electron microscopy". Proceedings of the National Academy of Sciences 102 (20): 7069–7073. doi:10.1073/pnas.0502607102. PMID 15883380. Bibcode: 2005PNAS..102.7069L. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=1129142
N.D.Browning; M.A.Bonds; G.H.Campbell; J.E.Evans; T.LaGrange; K.L.Jungjohann; D.J.Masiel; J.McKeown et al. (February 2012). "Recent developments in dynamic transmission electron microscopy". Current Opinion in Solid State and Materials Science 16 (1): 23–30. doi:10.1016/j.cossms.2011.07.001. Bibcode: 2012COSSM..16...23B. https://www.sciencedirect.com/science/article/pii/S1359028611000544.
King, Wayne E.; Geoffrey H. Campbell; Alan Frank; Bryan Reed (2005). "Ultrafast electron microscopy in materials science, biology, and chemistry". Journal of Applied Physics 97 (11): 111101–111101–27. doi:10.1063/1.1927699. Bibcode: 2005JAP....97k1101K. https://dx.doi.org/10.1063%2F1.1927699
B. Barwick; D. J. Flannigan; A. H. Zewail (December 2009). "Photon-induced near-field electron microscopy". Nature 462: 902–906. doi:10.1038/nature08662. https://www.nature.com/articles/nature08662.
Pennycook, S.J.; Varela, M.; Hetherington, C.J.D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy". MRS Bulletin 31: 36–43. doi:10.1557/mrs2006.4. http://web.pdx.edu/~pmoeck/pennycooks_aberration_corrected_microscopes.pdf.
Furuya, Kazuo (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Science and Technology of Advanced Materials 9 (1): 014110. doi:10.1088/1468-6996/9/1/014110. PMID 27877936. Bibcode: 2008STAdM...9a4110F. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=5099805
"Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters 102 (9): 096101. 2009. doi:10.1103/PhysRevLett.102.096101. PMID 19392535. Bibcode: 2009PhRvL.102i6101E. https://digital.library.unt.edu/ark:/67531/metadc927376/.
Stahlberg, Henning (September 6, 2012). "Contrast Transfer Functions". 2dx.unibas.ch. http://www.2dx.unibas.ch/workshop/2012/lecture-notes/ctf-the-contrast-transfer-function-by-henning-stahlberg/view.
Tanaka, Nobuo (2008). "Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials". Sci. Technol. Adv. Mater. 9 (1): 014111. doi:10.1088/1468-6996/9/1/014111. PMID 27877937. Bibcode: 2008STAdM...9a4111T. http://www.pubmedcentral.nih.gov/articlerender.fcgi?tool=pmcentrez&artid=5099806
Scale of Things Chart. Science.energy.gov http://science.energy.gov/bes/news-and-resources/scale-of-things-chart/
O’Keefe, Michael A.; Shao-Horn, Yang (2004). Imaging lithium atoms at sub-Ångström resolution (Report). Lawrence Berkeley National Laboratory. LBNL-56646. http://escholarship.org/uc/item/63p3p9gd.
O’Keefe, Michael A.; Allard, Lawrence F. (2004-01-18). "Sub-Ångstrom Electron Microscopy for Sub-Ångstrom Nano-Metrology". National Nanotechnology Initiative Workshop on Instrumentation and Metrology for Nanotechnology, Gaithersburg, MD (2004). osti.gov. http://www.osti.gov/bridge/servlets/purl/821768-E3YVgN/native/821768.pdf.

©Text is available under the terms and conditions of the Creative Commons-Attribution ShareAlike (CC BY-SA) license; additional terms may apply. By using this site, you agree to the Terms and Conditions and Privacy Policy.

Upload a video for this entry

Information

Subjects: Nuclear Science & Technology

Contributor MDPI registered users' name will be linked to their SciProfiles pages. To register with us, please refer to https://encyclopedia.pub/register :

HandWiki

View Times: 7.2K

Entry Collection: HandWiki

Update Date: 05 Dec 2022

Table of Contents

Video Upload Options

References