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HandWiki. Kikuchi Line. Encyclopedia. Available online: https://encyclopedia.pub/entry/35230 (accessed on 25 September 2026).
HandWiki. Kikuchi Line. Encyclopedia. Available at: https://encyclopedia.pub/entry/35230. Accessed September 25, 2026.
HandWiki. "Kikuchi Line" Encyclopedia, https://encyclopedia.pub/entry/35230 (accessed September 25, 2026).
HandWiki. (2022, November 18). Kikuchi Line. In Encyclopedia. https://encyclopedia.pub/entry/35230
HandWiki. "Kikuchi Line." Encyclopedia. Web. 18 November, 2022.
Kikuchi Line
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Kikuchi lines pair up to form bands in electron diffraction from single crystal specimens, there to serve as "roads in orientation-space" for microscopists not certain what they are looking at. In transmission electron microscopes, they are easily seen in diffraction from regions of the specimen thick enough for multiple scattering. Unlike diffraction spots, which blink on and off as one tilts the crystal, Kikuchi bands mark orientation space with well-defined intersections (called zones or poles) as well as paths connecting one intersection to the next. Experimental and theoretical maps of Kikuchi band geometry, as well as their direct-space analogs e.g. bend contours, electron channeling patterns, and fringe visibility maps are increasingly useful tools in electron microscopy of crystalline and nanocrystalline materials. Because each Kikuchi line is associated with Bragg diffraction from one side of a single set of lattice planes, these lines can be labeled with the same Miller or reciprocal-lattice indices that are used to identify individual diffraction spots. Kikuchi band intersections, or zones, on the other hand are indexed with direct-lattice indices i.e. indices which represent integer multiples of the lattice basis vectors a, b and c. Kikuchi lines are formed in diffraction patterns by diffusely scattered electrons, e.g. as a result of thermal atom vibrations. The main features of their geometry can be deduced from a simple elastic mechanism proposed in 1928 by Seishi Kikuchi, although the dynamical theory of diffuse inelastic scattering is needed to understand them quantitatively. In x-ray scattering these lines are referred to as Kossel lines (named after Walther Kossel).

x-ray scattering single crystal inelastic scattering

References

  1. J. C. H. Spence and J. Zuo (1992). "Ch. 9". Electron microdiffraction. Plenum, New York. ISBN 978-0-306-44262-9. 
  2. E. Levine; W. L. Bell; G. Thomas (1966). "Further applications of Kikuchi diffraction patterns; Kikuchi maps". Journal of Applied Physics 37 (5): 2141–2148. doi:10.1063/1.1708749. Bibcode: 1966JAP....37.2141L.  https://dx.doi.org/10.1063%2F1.1708749
  3. H. Hashimoto; A. Howie; M. J. Whelan (1962). "Anomalous Electron Absorption Effects in Metal Foils: Theory and Comparison with Experiment". Proceedings of the Royal Society A 269 (1336): 80. doi:10.1098/rspa.1962.0164. Bibcode: 1962RSPSA.269...80H.  https://dx.doi.org/10.1098%2Frspa.1962.0164
  4. P. Fraundorf; Wentao Qin; P. Moeck; Eric Mandell (2005). "Making sense of nanocrystal lattice fringes". Journal of Applied Physics 98 (11): 114308–114308–10. doi:10.1063/1.2135414. Bibcode: 2005JAP....98k4308F.  https://dx.doi.org/10.1063%2F1.2135414
  5. P. Wang; A. L. Bleloch; U. Falke; P. J. Goodhew (2006). "Geometric aspects of lattice contrast visibility in nanocrystalline materials using HAADF STEM". Ultramicroscopy 106 (4–5): 277–283. doi:10.1016/j.ultramic.2005.09.005.  https://dx.doi.org/10.1016%2Fj.ultramic.2005.09.005
  6. Wentao Qin; P. Fraundorf (2003). "Lattice parameters from direct-space images at two tilts". Ultramicroscopy 94 (3–4): 245–262. doi:10.1016/S0304-3991(02)00335-2. PMID 12524195.  https://dx.doi.org/10.1016%2FS0304-3991%2802%2900335-2
  7. Knoll M. (1935). "Aufladepotentiel und sekundäremission elektronenbestrahlter körper (Static potential and secondary emission of bodies under electron irradiation)". Z. Tech. Phys. 11: 467–475. 
  8. J. I. Goldstein; D. E. Newbury; P. Echlin; D. C. Joy; A. D. Romig Jr.; C. E. Lyman; C. Fiori; E. Lifshin (1992). Scanning electron microscopy and X-ray microanalysis. Plenum Press, NY. ISBN 978-0-306-44175-2. 
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