| Version | Summary | Created by | Modification | Content Size | Created at | Operation |
|---|---|---|---|---|---|---|
| 1 | Camila Xu | -- | 1355 | 2022-10-27 01:39:29 |
In microscopy, a scanning Kelvin probe (SKP) is a non-contact, non-destructive scanning probe microscopy (SPM) technique used to measure the work function of the sample under study. By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. It is predominantly used to measure corrosion and coatings. It is closely related to the Kelvin probe force microscope (KPFM) technique.