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| Version | Summary | Created by | Modification | Content Size | Created at | Operation |
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| 1 | Vivi Li | -- | 993 | 2022-10-24 01:45:38 |
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A single event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). The error in device output or operation caused as a result of the strike is called an SEU or a soft error. The SEU itself is not considered permanently damaging to the transistor's or circuits' functionality unlike the case of single event latchup (SEL), single event gate rupture (SEGR), or single event burnout (SEB). These are all examples of a general class of radiation effects in electronic devices called single event effects (SEE).
References
- Neutron-Induced Single Event Upset (SEU) FAQ, Microsemi Corporation, https://www.microsemi.com/document-portal/doc_download/130760-neutron-seu-faq, retrieved October 7, 2018, "The cause has been traced to errors in an on-board computer suspected to have been induced by cosmic rays."
- "A Survey of Techniques for Modeling and Improving Reliability of Computing Systems", Mittal et al., IEEE TPDS, 2015 https://dx.doi.org/10.1109/TPDS.2015.2426179
- Ian Johnston (17 February 2017). "Cosmic particles can change elections and cause planes to fall through the sky, scientists warn". Independent]. https://www.independent.co.uk/news/science/subatomic-particles-cosmic-rays-computers-change-elections-planes-autopilot-a7584616.html. Retrieved 5 September 2018.
