In this part, we encourage you to list the link of papers wrote by the character, or published reviews/articles about his/her academic contributions.
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References
"Lehrstuhl Prof. Dr. Franz J. Gießibl - Universität Regensburg". https://www.uni-regensburg.de/physik/giessibl/.
July 26, 2000 entry in https://www.gerhard-richter.com/en/chronology/
Nielsen, K. H. (2008). "Nanotech, Blur and Tragedy in Recent Artworks by Gerhard Richter". Leonardo 41 (5): 484–492. doi:10.1162/leon.2008.41.5.484. https://dx.doi.org/10.1162%2Fleon.2008.41.5.484
"Nanophysik: Atome unterm Mikroskop". Spiegel Online. 27 July 2000. http://www.spiegel.de/wissenschaft/mensch/nanophysik-atome-unterm-mikroskop-a-86908.html.
pop (23 January 2003). "Nanophysiker Franz Gießibl hantiert mit Apfelsinen". Die Welt. https://www.welt.de/print-welt/article351807/Nanophysiker-Franz-Giessibl-hantiert-mit-Apfelsinen.html.
Chang, Kenneth (22 February 2008). "Scientists Measure What It Takes to Push a Single Atom". The New York Times. https://www.nytimes.com/2008/02/22/science/22atom.html.
"Scanning Probe Microscopy: From Sublime to Ubiquitous". 2 May 2016. https://journals.aps.org/prl/scanning-probe-microscopy.
"Nature Nanotechnology's Anniversary issues of March and April 2016 mark the anniversary of a number of key discoveries in the history of nanotechnology.". http://www.nature.com/nnano/journal/v11/n4/pdf/nnano.2016.64.pdf.
Giessibl, F. J. (1995). "Atomic resolution of the Silicon (111)-(7x7) surface by atomic force microscopy.". Science 267 (5194): 68–71. doi:10.1126/science.267.5194.68. PMID 17840059. Bibcode: 1995Sci...267...68G. https://epub.uni-regensburg.de/33828/1/Atomic%20Resolution%20of%20the%20Silicon%20%28111%29-%287x7%29%20Surface%20by.pdf.
Giessibl, F. J.; Hembacher, S.; Bielefeldt, H.; Mannhart, J. (2000). "Subatomic features on the Silicon (111)-(7x7) surface observed by atomic force microscopy.". Science 289 (5478): 422–425. doi:10.1126/science.289.5478.422. PMID 10903196. Bibcode: 2000Sci...289..422G. https://epub.uni-regensburg.de/25316/1/Subatomic%20Features%20on%20the%20Silicon%20%28111%29.pdf.
Giessibl, F. J.; Pielmeier, F.; Eguchi, T.; An, T.; Hasegawa, Y. (2011). "Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators.". Phys. Rev. B 84 (12): 125409. doi:10.1103/physrevb.84.125409. Bibcode: 2011PhRvB..84l5409G. https://dx.doi.org/10.1103%2Fphysrevb.84.125409
Giessibl, F. J. (1997). "Forces and frequency shifts in atomic-resolution dynamic-force microscopy.". Phys. Rev. B 56 (24): 16010–16015. doi:10.1103/physrevb.56.16010. Bibcode: 1997PhRvB..5616010G. https://dx.doi.org/10.1103%2Fphysrevb.56.16010
Giessibl, F. J. (2003). "Advances in atomic force microscopy.". Reviews of Modern Physics 75 (3): 949–983. doi:10.1103/revmodphys.75.949. Bibcode: 2003RvMP...75..949G. https://dx.doi.org/10.1103%2Frevmodphys.75.949
F. J. Giessibl: Device for noncontact intermittent contact scanning of a surface and a process therefore. US Patent 6240771
F. J. Giessibl: Sensor for noncontact profiling of a surface. US Patent 8393009
R&D 100 Award 1994 of R&D Magazine http://www.rdmag.com/award-winners/1994/01/autoprobe-vp
"Augsburger Rasterkraftmikroskopie-Experte Gießibl erhält den Rudolf-Kaiser-Preis 2001". https://idw-online.de/de/news42734.
"Die Stiftung - Karl Heinz Beckurts-Stiftung". http://www.beckurts-stiftung.de/.
"Colloquium Ehrenfestii in 2010". http://www.lorentz.leidenuniv.nl/ce/archief/2010.html.
"Zernike Colloquium Franz J. Giessibl (Atomic force microscopy using the qPlus sensor: resolving charge distributions within atoms, exchange interactions and atomic resolution in ambient conditions) - Loos Group - MCNPM - Zernike (ZIAM) - Research - University of Groningen". 2013-09-14. https://www.rug.nl/research/zernike/macromolecular-chemistry-and-new-polymeric-materials/group-loos/agenda/colloquia_giessibl?lang=en.
"2014 Keithley Award Recipient". https://www.aps.org/programs/honors/prizes/prizerecipient.cfm?last_nm=Giessibl&first_nm=Franz&year=2014.
Kopnarski, Michael (2015). "Rudolf Jaeckel-Preis 2015 an Prof. Dr. Franz J. Gießibl". Vakuum in Forschung und Praxis 27 (5): 38. doi:10.1002/vipr.201590050. https://dx.doi.org/10.1002%2Fvipr.201590050
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