Tilted scanning electron microscopy (SEM) observation represents a powerful approach in secondary electron (SE) imaging, that can be conveniently adopted for visualizing 2D nanostructures, like graphene and other layered systems (e.g., MoS2 and WS2 monolayers). This SEM observation technique causes the SE generation in sample regions extremely close to the surface. Consequently, the SE yield (number of SE per primary electron) is maximum and highly contrasted SE-micrographs, very rich of morphological details on the sample surface, result. Tilted-SEM requires a special sample holder that allows vertical positioning of the specimen surface (the specimen is fixed to a standard aluminum stub). A number of tilted sample holder models are available for such type of SEM investigation technique.