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Gallium Nitride: History
Please note this is an old version of this entry, which may differ significantly from the current revision.
Contributor: Jack Zhong

Gallium nitride is a III-V compound semiconductor with a direct band gap of about 3.4 electronvolts at room temperature, crystallising in the wurtzite structure and remaining chemically stable and mechanically hard up to high temperature. Those properties, together with a breakdown field roughly ten times that of silicon, make it the basis of both short-wavelength light emitters and high-frequency power devices. It is not usually grown as a bulk crystal but epitaxially on foreign substrates, among them sapphire, silicon carbide and silicon, and the lattice and thermal mismatch with those substrates leaves threading dislocation densities far above those of mature semiconductors [1]. Achieving p-type conductivity proved the decisive obstacle: magnesium acceptors are passivated by hydrogen during growth, and low-energy electron beam irradiation or thermal annealing is needed to activate them [2]. Once p-type and n-type layers could be combined, bright blue indium gallium nitride light-emitting diodes followed and enabled solid-state white lighting [3]. In the electronic direction, the spontaneous and piezoelectric polarisation of an aluminium gallium nitride barrier induces a two-dimensional electron gas at its interface without any doping, and that gas carries the current of a high-electron-mobility transistor [4]. The remaining obstacles are the cost and the size of native substrates, and the trapping and degradation that limit the reliability of power transistors under switching [5].

  • gallium nitride
  • wide-band-gap semiconductor
  • wurtzite polarization
  • two-dimensional electron gas
  • light-emitting diode
  • efficiency droop
  • AlGaN/GaN heterostructure
  • power electronics

 

 

References

  1. Amano, H.; Kito, M.; Hiramatsu, K.; Akasaki, I.; P-Type Conduction in Mg-Doped GaN Treated with Low-Energy Electron Beam Irradiation (LEEBI). Japanese Journal of Applied Physics 1989, 28, L2112, 10.1143/jjap.28.l2112.
  2. Lee, J.H.; Im, K.S.; Growth of High Quality GaN on Si (111) Substrate by Using Two-Step Growth Method for Vertical Power Devices Application. Crystals 2021, 11, 234, 10.3390/cryst11030234.
  3. Nakamura, S.; Mukai, T.; Senoh, M.; Candela-class high-brightness InGaN/AlGaN double-heterostructure blue-light-emitting diodes. Applied Physics Letters 1994, 64, 1687-1689, 10.1063/1.111832.
  4. Ambacher, O.; Smart, J.; Shealy, J.R.; Weimann, N.G.; Chu, K.; Murphy, M.; Schaff, W.J.; Eastman, L.F.; Dimitrov, R.; Wittmer, L.; et al. Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures. Journal of Applied Physics 1999, 85, 3222-3233, 10.1063/1.369664.
  5. del Alamo, J.; Joh, J.; GaN HEMT reliability. Microelectronics Reliability 2009, 49, 1200-1206, 10.1016/j.microrel.2009.07.003.
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